Publications

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Total 47건 1 페이지
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No. 제목
47
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43
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41
International Conferences

2025 IEEE 21st International Conference on Automation Science and Engineering

2025년

Stacking Ensemble Method for Wafer Yield Prediction in Semiconductor Manufacturing
25.09.16 717
40
International Conferences

2025 IEEE 21st International Conference on Automation Science and Engineering

2025년

Automated Classification and Captioning for Wafer Bin Map Using Attention-based Image Captioning Approach
25.09.16 676
39
38
International Conferences

The 12th International Conference on Industrial Engineering and Applications (Eu…

2025년

Multistage Manufacturing Process Scheduling based on Quality Prediction Model and Reinforcement Learning
25.01.13 878
37
International Conferences

The 12th International Conference on Industrial Engineering and Applications Eur…

2025년

Identifying Abnormal Wafers in a Semiconductor Quality Control System by Using Object Detection Methods
25.01.13 865
36
International Conferences

The 12th International Conference on Industrial Engineering and Applications Eur…

2025년

FEM Surrogate Model Based on Convolutional Neural Network for Iterative Prediction of Deformation Behavior in H-beam Rolling Process
25.01.13 813
35
International Conferences

The 12th International Conference on Industrial Engineering and Applications (Eu…

2025년

Surrogate Modeling for H-Beam Reverse Tandem Mill Using Artificial Neural Networks Trained on Finite Element Method Data
25.01.13 867
34
International Conferences

The 12th International Conference on Industrial Engineering and Applications (Eu…

2025년

Multi-Modal Deep Learning Model for Wafer Bin Map Defect Analysis Using Defect Images and Text Data
25.01.13 952
33
International Conferences

The 12th International Conference on Industrial Engineering and Applications (Eu…

2025년

Yield Prediction using Graph Convolution Network in Multistage Manufacturing Process
25.01.13 804

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