Publications

Total 41건 1 페이지
Presentation 목록
No. 제목
41
International Conferences

2025 IEEE 21st International Conference on Automation Science and Engineering

2025년

Stacking Ensemble Method for Wafer Yield Prediction in Semiconductor Manufacturing
25.09.16 275
40
International Conferences

2025 IEEE 21st International Conference on Automation Science and Engineering

2025년

Automated Classification and Captioning for Wafer Bin Map Using Attention-based Image Captioning Approach
25.09.16 261
39
38
International Conferences

The 12th International Conference on Industrial Engineering and Applications (Eu…

2025년

Multistage Manufacturing Process Scheduling based on Quality Prediction Model and Reinforcement Learning
25.01.13 513
37
International Conferences

The 12th International Conference on Industrial Engineering and Applications Eur…

2025년

Identifying Abnormal Wafers in a Semiconductor Quality Control System by Using Object Detection Methods
25.01.13 460
36
International Conferences

The 12th International Conference on Industrial Engineering and Applications Eur…

2025년

FEM Surrogate Model Based on Convolutional Neural Network for Iterative Prediction of Deformation Behavior in H-beam Rolling Process
25.01.13 476
35
International Conferences

The 12th International Conference on Industrial Engineering and Applications (Eu…

2025년

Surrogate Modeling for H-Beam Reverse Tandem Mill Using Artificial Neural Networks Trained on Finite Element Method Data
25.01.13 489
34
International Conferences

The 12th International Conference on Industrial Engineering and Applications (Eu…

2025년

Multi-Modal Deep Learning Model for Wafer Bin Map Defect Analysis Using Defect Images and Text Data
25.01.13 504
33
International Conferences

The 12th International Conference on Industrial Engineering and Applications (Eu…

2025년

Yield Prediction using Graph Convolution Network in Multistage Manufacturing Process
25.01.13 466
32
International Conferences

Asia-Pacific Industrial Engineering and Management Systems Conference

2024년

Quality-based scheduling in a multistage manufacturing process using Reinforcement Learning
24.11.20 465
31
International Conferences

Informs (Institute for Operations Research and the Management Sciences) 2024 Ann…

2024년

Enhanced Detection of Unknown Defect Patterns on Wafer Bin Maps Based on Open-Set Recognition Approach
24.11.20 697
30
International Conferences

Informs (Institute for Operations Research and the Management Sciences) 2024 Ann…

2024년

Defining abnormal trends and identifying abnormal wafers using object detection methods
24.11.20 543
29
International Conferences

Informs (Institute for Operations Research and the Management Sciences) 2024 Ann…

2024년

Quality-based scheduling in a multistage manufacturing process using Monte Carlo Tree Search method
24.11.20 532
28
International Conferences

Informs (Institute for Operations Research and the Management Sciences) 2024 Ann…

2024년

Defect Detection for OHT Wheels in Semiconductor Manufacturing Processes Using Generative AI-based Data Augmentation
24.11.20 608
27
International Conferences

Informs (Institute for Operations Research and the Management Sciences) 2024 Ann…

2024년

Optimizing a rolling process for manufacturing small steel bars using CART
24.11.20 509

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