Papers 1 페이지 | 성균관대학교 품질공학연구실 홈페이지

Total 57건 1 페이지

Publications

IEEE Access

Cost-Stability Evaluation Framework for Reliable Deployment of Object Detectors in Industrial Applications

Engineering Failure Analysis

Improving quality and reliability of disposable desiccant to prevent condensation in automotive headlamps

Quality Engineering

MR-RF : A robust data mining method for multiresponse optimization using a random forest

Quality and Reliability Engineering International

Predicting remaining useful life and optimizing preventive maintenance for multistage manufacturing processes

Expert Systems With Applications

Development of a Suspiciousness Measure with Reduced Redundancy for Screening Machine Sets in Serial-Parallel Multistage Manufacturing Processes

Machines

Edge Computing-Based Digital Twin Framework Based on ISO 23247 for Enhancing Data Processing Capabilities

Computers in Industry

Enhanced Detection of Unknown Defect Patterns on Wafer Bin Maps Based on an Open-Set Recognition Approach

Expert Systems With Applications

A Framework for Detecting Unknown Defect Patterns on Wafer Bin Maps Using Active Learning

Computers & Industrial Engineering

Similarity searching for wafer bin maps by measuring shape, location, and size similarities of defect patterns

Materials & Design

Response to “Comments on Seo et al., Materials & Design 117 (2017) 131–138, DOI: 10.1016/j.matdes.2016.12.066”

International Journal of Advanced Manufacturing Technology

Prediction of spring steel wire rod hardness based on wire rod rolling process data: a case study

Advanced Engineering Informatics

Development of a Spatial Dimension-based Taxonomy for Classifying the Defect Patterns in a Wafer Bin Map

Quality Engineering

A process capability function approach to multiple response surface optimization based on a posterior procedure

International Journal of Precision Engineering and Manufacturing

Identifying Quality Factors for Surface Defects on Small Steel Bars Using a Two-step Method of Statistical Difference Testing and k-means Clustering

Computers in Industry, 152, 104005

Development of taxonomy for classifying defect patterns on wafer bin map using Bin2Vec and clustering methods