Papers 2 페이지 | 성균관대학교 품질공학연구실 홈페이지

Total 64건 2 페이지

Publications

Computers & Industrial Engineering

Similarity searching for wafer bin maps by measuring shape, location, and size similarities of defect patterns

Materials & Design

Response to “Comments on Seo et al., Materials & Design 117 (2017) 131–138, DOI: 10.1016/j.matdes.2016.12.066”

International Journal of Advanced Manufacturing Technology

Prediction of spring steel wire rod hardness based on wire rod rolling process data: a case study

Advanced Engineering Informatics

Development of a Spatial Dimension-based Taxonomy for Classifying the Defect Patterns in a Wafer Bin Map

Quality Engineering

A process capability function approach to multiple response surface optimization based on a posterior procedure

International Journal of Precision Engineering and Manufacturing

Identifying Quality Factors for Surface Defects on Small Steel Bars Using a Two-step Method of Statistical Difference Testing and k-means Clustering

Computers in Industry, 152, 104005

Development of taxonomy for classifying defect patterns on wafer bin map using Bin2Vec and clustering methods

Sensors and Actuators: A. Physical, 352, 114205

Development of a CNN-based Real-Time Monitoring Algorithm for Additively Manufactured Molybdenum

Journal of Food Measurement and Characterization,16, 2999–3009

A two-stage automatic labeling method for detecting abnormal food items in X-ray images

International Journal of Advanced Manufacturing Technology, 120, 7771-7783

Optimizing the mean and variance of bead geometry in the wire + arc additive manufacturing using a desirability function method

Journal of Intelligent Manufacturing, 33, 167-183

Approach to Derive Golden Paths based on Machine Sequence Patterns in Multistage Manufacturing Process

Expert Systems with Applications, 195, 116606

EWMA-PRIM: Process optimization based on time-series process operational data using the Exponentially Weighted Moving Average and Patient Rule Induction Method

Journal of Materials Processing Technology, 302, 117495

Real-time anomaly detection using convolutional neural network in wire arc additive manufacturing: Molybdenum material

Computers & Industrial Engineering, 162, 107767

An oversampling method for wafer map defect pattern classification considering small and imbalanced data

Journal of Manufacturing Systems, 61, 77-86

Approach to derive golden paths under time-varying machine performance in multistage manufacturing process