Papers 1 페이지 | 성균관대학교 품질공학연구실 홈페이지

Total 63건 1 페이지

Publications

Computers and Operations Research

A Dual GCN–MCTS Framework for Yield-Aware Scheduling in Multistage Manufacturing

Algorithms

Managing cost–stability trade-offs in industrial object detection: a unified decision support framework

CMC-Computers, Materials & Continua

A Hybrid Physics-informed and Data-driven Feature Framework with Explicit Correlation-Structure Embeddings for Early-life Prognostics of Lithium-ion Batteries

Quality and Reliability Engineering International

Data-driven Methods for Multiple and Dual Response Optimization on Operational Data Using Stochastic PRIM

Journal of Intelligent Manufacturing

Rule-Based Neural Surrogate for Real-Time FEM Prediction in H-Beam Manufacturing

International Journal of Advanced Manufacturing Technology

Semantic Segmentation of Steel Wire Rod Thermal Images for Automated Temperature Measurement

IEEE Access

Cost-Stability Evaluation Framework for Reliable Deployment of Object Detectors in Industrial Applications

Engineering Failure Analysis

Improving Quality and Reliability of Disposable Desiccant to Prevent Condensation in Automotive Headlamps

Quality Engineering

MR-RF : A Robust Data Mining Method for Multiresponse Optimization Using a Random Forest

Quality and Reliability Engineering International

Predicting Remaining Useful Life and Optimizing Preventive Maintenance for Multistage Manufacturing Processes

Expert Systems With Applications

Development of a Suspiciousness Measure with Reduced Redundancy for Screening Machine Sets in Serial-Parallel Multistage Manufacturing Processes

Machines

Edge Computing-Based Digital Twin Framework Based on ISO 23247 for Enhancing Data Processing Capabilities

Computers in Industry

Enhanced Detection of Unknown Defect Patterns on Wafer Bin Maps Based on an Open-Set Recognition Approach

Expert Systems With Applications

A Framework for Detecting Unknown Defect Patterns on Wafer Bin Maps Using Active Learning

Computers & Industrial Engineering

Similarity searching for wafer bin maps by measuring shape, location, and size similarities of defect patterns