Publications

Total 11건 1 페이지
Papers 목록
No. 제목
11
Conference Papers

2025 IEEE Proceedings : 21st International Conference on Automation Science and …

2025년

Stacking Ensemble Method for Wafer Yield Prediction in Semiconductor Manufacturing
25.12.19 644
Link
10
Conference Papers

2025 IEEE Proceedings : 21st International Conference on Automation Science and …

2025년

Automated Classification and Captioning for Wafer Bin Map Using Attention-based Image Captioning Approach
25.12.19 441
Link
9
Conference Papers

2025 IEEE Proceedings : 21st International Conference on Automation Science and…

2025년

A Model Predictive Control-Based Scheduling for Optimizing both Quality and Productivity in Multistage Manufacturing Process
25.12.19 537
Link
8
Conference Papers

ICIEAEU '25: Proceedings of the 2025 12th International Conference on Industrial…

2025년

Development of an OHT Wheel Reliability Fault Detection Model using Generative AI-Based Virtual Fault Augmentation
25.12.18 473
Link
7
Conference Papers

ICIEAEU '25: Proceedings of the 2025 12th International Conference on Industrial…

2025년

Yield Prediction using Graph Convolution Network in Multistage Manufacturing Process
25.12.18 488
Link
6
Conference Papers

ICIEAEU '25: Proceedings of the 2025 12th International Conference on Industrial…

2025년

FEM Surrogate Model Based on Convolutional Neural Network for Iterative Prediction of Deformation Behavior in H-beam Rolling Process
25.12.18 461
Link
5
Conference Papers

ICIEAEU '25: Proceedings of the 2025 12th International Conference on Industrial…

2025년

Surrogate Modeling for H-Beam Reverse Tandem Mill Using Artificial Neural Networks Trained on Finite Element Method Data
25.12.18 387
Link
4
Conference Papers

ICIEAEU '24: Proceedings of the 2024 11th International Conference on Industrial…

2024년

Path Score Based Approach for Deriving Machine Sequence in Multistage Process
24.02.19 1022
Link
3
Conference Papers

ICIEAEU '24: Proceedings of the 2024 11th International Conference on Industrial…

2024년

A Multi Step Approach for Identifying Unknown Defect Patterns on Wafer Bin Map
24.02.19 1251
Link
2
Conference Papers

ICIEAEU '24: Proceedings of the 2024 11th International Conference on Industrial…

2024년

Full-Length Hardness Prediction in Wire Rod Manufacturing Using Semantic Segmentation of Thermal Images
24.02.19 899
Link
1
Conference Papers

Proceedings of the 10th International Conference on Industrial Engineering and A…

2023년

A two-step method of statistical difference testing and K-means clustering for identifying quality factors of small steel bars
24.02.06 966
Link

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