Papers 3 페이지 | 성균관대학교 품질공학연구실 홈페이지

Total 69건 3 페이지

Publications

Quality Engineering, 33(3), 457-473

MR-CART: multiresponse optimization using a classification and regression tree method

IEEE Transactions on Reliability, 70(1), 175-187

A Robust Interactive Desirability Function Approach for Multiple Response Optimization Considering Model Uncertainty

Quality and Reliability Engineering International, 36(6), 1982-2002

Multiresponse optimization of a multistage manufacturing process using a patient rule induction method

Quality and Reliability Engineering International, 36(6), 1931-1978

A method of steepest ascent for multiresponse surface optimization using a desirability function method

Quality Engineering, 32(4), 627-642

Optimizing mean and variance of multiresponse in a multistage manufacturing process using operational data

Advanced Engineering Informatics, 46, 101136

Ensemble deep learning based semi-supervised soft sensor modeling method and its application on quality prediction for coal preparation process

Engineering Optimization, 52(10), 1743-1760

A Pairwise Comparison-Based Interactive Procedure for Process Capability Approach to Multiple Response Surface Optimization

Communications in Statistics - Theory and Methods, 49(13), 3137-3152

An inspection procedure for radio frequency repeaters using a multiple linear regression method

Computers & Industrial Engineering, 140, 10284

An integrated computational intelligence technique based operating parameters optimization scheme for quality improvement oriented process-manufacturing system

Journal of the Korean Institute of Industrial Engineers, 46(5), 452-465

한국제조기업의 기술협력 파트너쉽 유형과 제품혁신 성과의 통계적 상관관계에 대한 연구

Procedia Manufacturing, 39, 618-624

Optimizing Mean and Variance of Multiresponse in a Multistage Manufacturing Process Using a Patient Rule Induction Method

Journal of Manufacturing Systems, 52, 146-156

A data-driven approach to selection of critical process steps in the semiconductor manufacturing process considering missing and imbalanced data

Journal of Manufacturing Systems, 52, 23-31

A method for wafer assignment in semiconductor wafer fabrication considering both quality and productivity perspectives

International Journal of Industrial Engineering, 26(1), 83-91

Prediction of times-to-failure of semiconductor chips using VMIN data

Quality Technology & Quantitative Management, 16(1), 95-112

Generating evenly distributed nondominated solutions in dual response surface optimization