Papers 1 페이지 | 성균관대학교 품질공학연구실 홈페이지

Total 62건 1 페이지

Publications

Computers in Industry

Enhanced Detection of Unknown Defect Patterns on Wafer Bin Maps Based on an Open-Set Recognition Approach

Expert Systems With Applications (ESWA)

A Framework for Detecting Unknown Defect Patterns on Wafer Bin Maps Using Active Learning

Computers & Industrial Engineering

Similarity searching for wafer bin maps by measuring shape, location, and size similarities of defect patterns

Materials & Design

Response to “Comments on Seo et al., Materials & Design 117 (2017) 131–138, DOI: 10.1016/j.matdes.2016.12.066”

International Journal of Advanced Manufacturing Technology

Prediction of spring steel wire rod hardness based on wire rod rolling process data: a case study

Advanced Engineering Informatics

Development of a Spatial Dimension-based Taxonomy for Classifying the Defect Patterns in a Wafer Bin Map

ICIEAEU '24: Proceedings of the 2024 11th International Conference on Industrial…

Path Score Based Approach for Deriving Machine Sequence in Multistage Process

ICIEAEU '24: Proceedings of the 2024 11th International Conference on Industrial…

A Multi Step Approach for Identifying Unknown Defect Patterns on Wafer Bin Map

Journal of the Korean Institute of Industrial Engineers, 49(2), 107-119

다단계 제조 공정의 단계 수준별 잔여 유효 수명 및 최적 교체 시간 예측 방법

ICIEAEU '24: Proceedings of the 2024 11th International Conference on Industrial…

Full-Length Hardness Prediction in Wire Rod Manufacturing Using Semantic Segmentation of Thermal Images

Quality Engineering

A process capability function approach to multiple response surface optimization based on a posterior procedure

Proceedings of the 10th International Conference on Industrial Engineering and A…

A two-step method of statistical difference testing and K-means clustering for identifying quality factors of small steel bars

International Journal of Precision Engineering and Manufacturing

Identifying Quality Factors for Surface Defects on Small Steel Bars Using a Two-step Method of Statistical Difference Testing and k-means Clustering

Computers in Industry, 152, 104005

Development of taxonomy for classifying defect patterns on wafer bin map using Bin2Vec and clustering methods

Sensors and Actuators: A. Physical, 352, 114205

Development of a CNN-based Real-Time Monitoring Algorithm for Additively Manufactured Molybdenum